LATTICE STRAIN ANALYSIS OF TITANIUM ROD PROCESSED BY EQUAL-CHANNEL ANGULAR PRESSING (ECAP) WITH Bc ROUTE USING X-RAY DIFFRACTION LINE BROADENING ANALYSIS
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References
Kardashev, B. K., Narykova, M. V., Betekhtin, V. I., Kadomtsev, A. G. Evolution of Elastic Properties of Ti and its Alloys due to Severe Plastic Deformation. Physical Mesomechanics. 2020; 23: 193-198. doi: 10.1134/S1029959920030029.
Semenova, I. P., Polyakov, A. V., Raab, G. I., Lowe, T. C., Valiev, R. Z. Enhanced Fatigue Properties of Ultrafine-Grained Ti Rods Processed by ECAP-conform. Journal of Materials Science. 2012; 47: 7777-7781. doi: 10.1007/s10853-012-6675-9.
Manjunath, G. K., Udaya Bhat, K., Preetham Kumar, G. V., Ramesh, M. R. Microstructure and Wear Performance of ECAP Processed Cast Al-Zn-Mg Alloys. Transactions of the Indian Institute of Metals. 2018; 71: 1919-1931. doi: 10.1007/s12666-018-1328-6.
Suryanarayana, C. and Grant Norton, M. 1998. X-ray Diffraction: a Practical Approach. New York, New York: Plenum Press.
Dey, P. C., Das, R. Impact of Silver Doping on the Crystalline Size and Intrinsic Strain of MPA-Capped CdTe Nanocrystals: a Study by Williamson-Hall Method and Size-Strain Plot Method. Journal of Materials Engineering and Performance. 2021. doi: 10.1007/s11665-020-05358-9.
Erdogan, E. X-ray Line Broadening Study on Sputtered InGaN Semiconductor with Evaluation of Williamson-Hall and Size-Strain Plot Methods. Indian Journal of Physics. 2019; 93: 1313-1318. doi: 10.1007/s12648-019-01403-z.
Islam, S. A. U., Ikram, M. Structural Stability Improvement, Williamson Hall Analysis and Band-gap Tailoring through A-site Sr Doping in Rare Earth Based Double Perovskite La2NiMnO6. Rare Metals. 2019; 38: 805-813. doi: 10.1007/s12598-019-01207-4.
Kulkarni, A. B., Mathad, S. N. Synthesis and Structural Analysis of Co-Zn-Cd Ferrite by Williamson-Hall and Size-Strain Plot Methods. International Journal of Self-Propagating High-Temperature Synthesis. 2018; 27: 37-43. doi: 10.3103/S10613862180 1003X.
Madhavi, J. Comparison of Average Crystallite Size by X-ray Peak Broadening and Williamson-Hall and Size-Strain Plots for VO2+ Doped ZnS/CdS Composite Nanopowder. SN Applied Sciences. 2019; 1: 1509. doi: 10.1007/s42452-019-1291-9.
Norouzzadeh, P., Mabhouti, K., Golzan, M. M., Naderali, R. Consequence of Mn and Ni Doping on Structural, Optical and Magnetic Characteristics of ZnO Nanopowders: the Williamson-Hall Method, the Kramers-Kronig Approach and Magnetic Interactions. Applied Physics A. 2020; 126: 154. doi: 10.1007/s00339-020-3335-9.
Pushkarev, S. S., Grekhov, M. M., Zenchenko, N. V. X-ray Diffraction Analysis of Features of the Crystal Structure of GaN/Al0.32Ga0.68N HEMT-Heterostructures by the Williamson-Hall Method. Semiconductors. 2018; 52: 734-738. doi: 10.1134/S1063782618060209.
Kafashan, H. X-ray Diffraction Line Profile Analysis of Undoped and Se-Doped SnS Thin Films Using Scherrer’s, Williamson-Hall and Size-Strain Plot Methods. Journal of Electronic Materials. 2018; 48: 1294-1309. doi: 10.1007/s11664-018-6791-7.
Vajo, J. J., Adjorlolo, A. A., Graetz, J. Titanium-based Coatings and Methods for Making Coatings. EP3677705A2 (Patent). 2020.